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Free eBook Secondary Ion Mass Spectrometry: 1987, Versailles, France 6th: International Conference on Secondary Ion Mass Spectrometry download

by A. Benninghoven,etc.,A. Huber,H.W. Werner

Free eBook Secondary Ion Mass Spectrometry: 1987, Versailles, France 6th: International Conference on Secondary Ion Mass Spectrometry download ISBN: 0471918326
Author: A. Benninghoven,etc.,A. Huber,H.W. Werner
Publisher: John Wiley & Sons Ltd (May 25, 1988)
Language: English
Pages: 1078
Category: Math Science
Subcategory: Chemistry
Size MP3: 1478 mb
Size FLAC: 1321 mb
Rating: 4.8
Format: rtf mbr docx doc


Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions.

Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions.

Secondary Ion Mass Spectrometry, A Practical Handbook for Depth Profiling and Bulk Impurity Analysis .

Secondary Ion Mass Spectrometry, A Practical Handbook for Depth Profiling and Bulk Impurity Analysis, R. G. Wilson, . Magee (John Wiley and Sons, 1989) ISBN 0-471-51945-6. 12. D. PHINNEY, Semi-Quantitative Analysis of Microstructures by Secondary Ion Mass Spectrometry, in the Proceedings of EMAS 2005 (Florence, 2005) p. 7. oogle Scholar. SIMS XIII: Proceedings of the Thirteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics, Benninghoven, Applied Surface Science, 203 (2003) p. 20. A. benninghoven, j. L. hunter, jr.

Are you sure you want to remove International Conference on Secondary Ion Mass Spectrometry.

Congresses, Secondary ion mass spectrometry. Are you sure you want to remove International Conference on Secondary Ion Mass Spectrometry. 6th 1987 Versailles, France) from your list?

A. Benninghoven, F. Rudenauer andH.

A. W. Werner, Secondary Ion Mass Spectrometry (Wiley, New York, 1987). 76 (1987) 12. 48. J. C. Pivin, C. Roques-Carmes andG.

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector. While mass spectrometry is built solidly on developments in the 20th century, there are new technologies that will push the limits in terms of precision, accuracy, and sample efficiency. 84, 013704 (2013); 1. 063/1. Time-of-flight secondary ion mass spectrometry chemical imaging analysis of micropatterns of streptavidin and. cells without labeling. Developments of new instruments based on time-of-flight mass spectrometers could open up the ultimate levels of sensitivity per sample atom.

Secondary Ion Mass Spectrometry book

Secondary Ion Mass Spectrometry book. Huber, and H. Werner "The international SIMS conferences have been held every two years since 1977.

Secondary Ion Mass Spectrometry Proceedings of the Sixth International Conference on Secondary Ion Mass .

Huber, and H. Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Rüdenauer, and H. Werner " is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry.

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Secondary ion mass spectrometry Secondary ion mass spectrometry CAMECA IMS3f Magnetic SIMS .

Secondary ion mass spectrometry Secondary ion mass spectrometry CAMECA IMS3f Magnetic SIMS Instrument Acronym SIMS Classification Mass spectrometry Analytes. Secondary ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. While only charged secondary ions emitted from the material surface through the sputtering process are used to analyze the chemical composition of the material, these represent a small fraction of the particles emitted from the sample.

Выделяйте текст, добавляйте закладки и делайте заметки, скачав книгу "Secondary Ion Mass Spectrometry .

Выделяйте текст, добавляйте закладки и делайте заметки, скачав книгу "Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981" для чтения в офлайн-режиме. Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants.

The SIMS conference is recognized worldwide as a distinguished forum for those involved in the study and use of SIMS techniques, bringing together scientists working in fundamental research and instrument development, researchers using the SIMS method of analysis, service companies and instrument manufacturers. This book provides a comprehensive overview by leading experts, not only about current applications but also potential future uses for this increasingly important technique. The contents include details of the latest developments, notably the understanding of fundamental phenomena; the development of instruments which can exploit secondary emission phenomena for the purpose of elementary and isotopic analysis of very small quantities of matter; applications in many fields of science and technology: electronics, metallurgy, surfaces, organic materials, biology, medicine and geology.